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Tried and tested stand-alone-systems for every inspection task:
  • solder ribbon control
  • laser alignment for ablation and structuring
  • electroluminescence inspection
  • broken edge (chamfer) detection
  • highly precise positioning
  • 2D code reading
  • surface inspection
  • print inspection
PDF downloads for VC Solar Solution and VC4067/NIR Smart Camera:

VC4067NIR_EL_E_Euro.pdf

VC_Solar_Solution_DE_EN.pdf

VC Solar Solution

Inspecting solar cells with VC Smart Cameras

Wafer Handling, Robot-Guidance Solution

The VC Solar Solar Solution is the ideal solution for cost-efficient solar cell production with optimal quality. VC Smart Cameras are easy to integrate and optimally for use of different optical inspection tasks in the production process.

In complete autonomy, our Line Scan or Area Smart Cameras reliably check in real time. Moreover, we provide the near infrared Smart Camera VC4067/NIR, especially developed for Electroluminescence inspection, or customized Smart Cameras.

The VC Solar Solution is custom-tailored and the ideal hardware and software solution for all inspection tasks in the solar cell production.

Wafer handling with standard components

Robot-Guidance-Solution for Wafer Handling

The VC Solar Solution is a full-fledged robot-guidance solution. The wafer can be positioned with accuracies better than 2 µm. The rotation can be identified at 1/1000 degrees exactly. The wafer's detection is guaranteed even under difficult environmental circumstances, e.g. if the wafer's edge is covered by the robot. Thus, the wafers can be positioned optimally for further production steps.

Electroluminescence inspection

Polycristalline wafer with hairline crack

VC4067/NIR near infrared Smart Camera was primarily developed for EL inspection. The Smart Camera detects reliably micro cracks, shunts and disconnected fingers. VC4067/NIR is an extremely cost-efficient alternative to other camera systems with comparable performance. Click here to learn more about VC4067/NIR Smart Camera or download the PDF on the right side.

Broken edge detection

Wafer edge break detection

VC Solar Solution guarantees an broken edge (chamfer) detection at 100 %. Even for defects smaller than 1/10 mm! Damaged wafer can be rejected before being processed to avoid consequential costs. Thanks to the system's excellent performance, processing time under 100 ms is warranted.

 

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